EDUCATION

1993   Ph.D. Engineering, Kyoto University, Kyoto, Japan

          (Dissertation: Research on the detector absolute spectral responsivity standards and their application to photometric unit realization.)

1977   B.S. in electrical engineering, Kyoto Institute of Technology, Kyoto, Japan

PROFESSIONAL EXPERIENCE

1992 - current     National Institute of Standards and Technology, as NIST Fellow (2010 – current), Group Leader (2003 – 2012), Project leader for photometry (1992 – 2003) at Optical Technology Division, now Sensor Science Division.

1984 – 1986       Guest researcher at National Bureau of Standards (now NIST)

                            (Research on integrating sphere modeling and total flux calibration)

1978 - 1992       Lighting Research Laboratory, Matsushita Electric Industrial Co. (now Panasonic Corp.), Japan.  (Senior researcher, 1986-1992) 

Y. Ohno is currently Past President of CIE. He served as President of CIE (2015-2019), Vice President-Technical of CIE (2011-2015), Director of CIE Division 2 - Physical Measurement of Light and radiation (2007-2011), Secretary of CIE Div.2 (1996- 2007).   

AWARD

NIST Edward Bennett Rosa Award, December 2015

U.S. Department of Energy SSL Visionary Award, January 2014

NIST Fellow, National Institute of Standards and Technology, December 2010

U.S. Department of Commerce Silver Medal Award, November 2009

CIE de Boer Gold Pin Award, July 2007

Arthur Flemming Award, 2006

IESNA Fellow, May 2006

U.S. Department of Commerce Bronze Medal Award, Dec. 1999

Paper Award, Illuminating Engineering Institute of Japan, July 1994