Dr. Cao Jianlin graduated from the Department of Physics of Fudan University in 1982. In 1989, he got his PhD degree from the program jointly organized by Chinese Academy of Sciences Changchun Institute of Optics and Fine Mechanics (CIOFM) and Japan's Tohoku University. From 1989 to 1992, he accomplished his postdoctoral research at CIOFM. Later he worked as research fellow, supervisor of PhD students, Executive Deputy Director (legal representative) and Director of CIOFM as well as the Director of CAS Changchun Institute of Optics, Fine Mechanics and Physics. He then served as assistant to President of CAS, head of the preparatory group of CAS Opto-Electronics Group, and president of CAS Academy of Opto-electronics. In January 2005, he was nominated as Vice President and member of the Party Leading Group of CAS, and as president of CAS Academy of Opto-electonics and Director of State Key Laboratory of Applied Optics. From September 2006 to November 2015, he was Vice Minister of Science and Technology and member of the CPC Leading Group of MOST. Vice Minister Cao is in charge of high and new technologies and international cooperation. He oversees the Department of Hi-tech Development and Industrialization, the Department of International Cooperation (Office for Hong Kong, Macao and Taiwan Affairs) and the Joint Office for 863 Program.

Dr Cao Jianlin's research on soft X-ray multilayer film technology has achieved outstanding achievements recognised by peer experts at home and abroad.

For the first time in the international arena, a physical model that takes into account multiple reflections was used, and for the first time, methods and procedures for resolving data on soft X-ray multilayer film thicknesses, surfaces and interfaces were fitted with an accuracy that reached the limits of current reflectance measurements in the soft X-ray band.

For the first time, the error of optical constants was estimated by numerical analysis, and the soft X-ray ultra thin film optical constants of a batch of materials were precisely determined, filling the data gap in this area internationally.

presided over the design and development of the first ion beam measurement and emission coating equipment in China, the technical performance of which reached the international advanced level for this type of product; the prepared multilayer film reflector was applied to a national key project with an effective GL value of 17.5, which was the highest in the world.

Provided multi-layer film mirrors for X-ray lasers for the internationally renowned Rutherford Laboratory in the UK, etc. and achieved satisfactory results, which won honour for the Chinese optics industry. Published more than 80 papers in academic journals at home and abroad.